发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 To provide a manufacturing method of a semiconductor device in which manufacturing cost can be reduced, and a manufacturing method of a semiconductor device with reduced manufacturing time and improved yield. A manufacturing method of a semiconductor device is provided, which includes the steps of forming a first layer containing a metal over a substrate, forming a second layer containing an inorganic material on the first layer, forming a third layer including a thin film transistor on the second layer, irradiating the first layer, the second layer, and the third layer with laser light to form an opening portion through at least the second layer and the third layer.
申请公布号 WO2006123825(A1) 申请公布日期 2006.11.23
申请号 WO2006JP310282 申请日期 2006.05.17
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;YAMADA, DAIKI;DOZEN, YOSHITAKA 发明人 YAMADA, DAIKI;DOZEN, YOSHITAKA
分类号 H01L21/02;G06K19/07;G06K19/077;H01L21/336;H01L27/12;H01L29/786 主分类号 H01L21/02
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