发明名称 POLISHING AGENT AND POLISHING METHOD
摘要 To provide a polishing composition which has a high removal rate and enables to suppress occurrence of dishing and erosion, in polishing of a surface to be polished in the production of a semiconductor integrated circuit device. A chemical mechanical polishing composition for polishing a surface to be polished of semiconductor integrated circuit devices comprises (A) fine oxide particles, (B) pullulan, and (C) water. The polishing composition further contains (D) an oxidizing agent, and (E) a compound represented by the formula 1: wherein R is a hydrogen atom, a C 1-4 alkyl group, a C 1-4 alkoxy group or a carboxylic acid group.
申请公布号 EP1724819(A1) 申请公布日期 2006.11.22
申请号 EP20050720184 申请日期 2005.03.07
申请人 ASAHI GLASS COMPANY, LIMITED;SEIMI CHEMICAL CO., LTD. 发明人 TAKEMIYA, SATOSHI;SHINMARU, SACHIE,
分类号 H01L21/304;B24B37/00;C09K3/14;H01L21/3105;H01L21/321 主分类号 H01L21/304
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