发明名称 Semiconductor memory device
摘要 A semiconductor memory device includes a cell block composed of several series-connected units having a ferroelectric capacitor and a cell transistor parallel-connected to the ferroelectric capacitor and a select transistor connected to an end of the cell block. Mutually separated first impurity diffusion layers are formed on the surface of the semiconductor substrate along a first direction, and have a first area. A second impurity diffusion layer is formed on the surface of the semiconductor substrate separated from the end first impurity diffusion layer, and has a second area. A first gate electrode is provided on the semiconductor substrate between the first impurity diffusion layers along a second direction. A second gate electrode is provided on the semiconductor substrate between the end first impurity diffusion layer and the second impurity diffusion layer along a second direction. A contact electrically connects a bit line and the second impurity diffusion layer.
申请公布号 US7138674(B2) 申请公布日期 2006.11.21
申请号 US20030624483 申请日期 2003.07.23
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIGA HIDEHIRO;SHIRATAKE SHINICHIRO;TAKASHIMA DAISABURO
分类号 G11C11/22;G11C11/14;H01L21/8246;H01L27/105;H01L27/108;H01L27/115 主分类号 G11C11/22
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