发明名称 |
Hierarchically-controlled automatic test pattern generation |
摘要 |
Hierarchically-controlled automatic test pattern generation (ATPG) is provided. One embodiment comprises a method for automatically generating test patterns for testing a device under test. Briefly described, one such method comprises the steps of: receiving a hierarchical model of a device under test, the hierarchical model comprising at least one low-level design component and at least one high-level design component which contains the low-level design component; selecting a fault to be detected in the device under test; and performing an automatic test pattern generation (ATPG) algorithm on the design components based on the hierarchy of the hierarchical model.
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申请公布号 |
US7139955(B2) |
申请公布日期 |
2006.11.21 |
申请号 |
US20020321758 |
申请日期 |
2002.12.17 |
申请人 |
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. |
发明人 |
ROHRBAUGH JOHN G;REARICK JEFF |
分类号 |
G06F11/00;G06F7/62;G06F17/50 |
主分类号 |
G06F11/00 |
代理机构 |
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