发明名称 LASER SCANNING MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To prevent the overheat and break of a scanner due to an excessive current, even if the deflection limit of the scanner is set erroneously. SOLUTION: A laser scanning microscope, preferably with linear scanning function, is a microscope where radiation light is guided along a sample by using at least one galvanometer scanner 51, where the scanner is provided with a mechanical deflection limitation mechanism, and measurement means 52 and 54 for measuring current increase are provided and are switched off, until the voltage of the scanner 51 reaches below a threshold, when the voltage reaches the threshold value. Preferably, the microscope is provided with an optical and/or acoustic display for displaying the on/off of the switch of the scanner. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006313354(A) 申请公布日期 2006.11.16
申请号 JP20060128570 申请日期 2006.05.02
申请人 CARL ZEISS MICROIMAGING GMBH 发明人 BLOOS HELMUT
分类号 G02B21/24;G02B26/10 主分类号 G02B21/24
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