METHOD AND APPARATUS FOR CONCURRENTLY MEASURING MAGNETOSTRICTION AND MAGNETIZATION

摘要

Conventionally separate devices are provided to measure magnetostriction and magnetization in an effort to observe them in the same area of a sample because magnetostriction measuring requires the magnetization measurement of an object sample. Observing these in the same are is difficult due to difficulties in correction and calibration. A magnetostrictive coefficient in an external mode does not provide a definite value in a low temperature area. A convenient technique is developed that can concurrently observe magnetostriction and magnetization in the same area of a sample by newly combining a magnetostriction measuring technique by an X-ray diffraction method and an X-ray magnetic diffraction method. The technique measures the relative changes d in diffraction light intensity within a magnetic field for the same area of a sample at a magnetic field rise time and a magnetic field fall time respectively, a dissymmetric component d<SUB>A</SUB> and a symmetric component d<SUB>S</SUB> with respect to the magnetic field H are determined from them, the magntostrictive coefficient ?<SUB>100</SUB> of the area of the sample is determined based on the symmetric component d<SUB>S</SUB>, and the relative magnetization M/M<SUB>s</SUB> of the area of the sample is determined based on a quantity R'<SUB>a</SUB> obtained by re-synthesizing the dissymmetric component d<SUB>A</SUB> and the symmetric component d<SUB>S</SUB>. When a condition is used under which a microscopic crystalline magnetostrictive coefficient value obtain by X-ray coincides with magnetostrictive coefficient value in a macroscopic external mode, a convenient method is provided for apparatus calibration or the like.