| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a flash EEPROM capable of executing efficient burn-in test is built and provide its burn-in test method. SOLUTION: By changing the level of a control signal C2 from a mode selection part 40, the operation mode of a function part 10 is changed over from normal mode to test mode for reading data from a ROM 30 in which command codes for test are stored. By changing the level of the first control signal C1 under the test mode to redirect output of a first selection circuit 12 and change over the operation of a program counter 11, a first burn-in mode for activating the flash EEPROM 20 and second burn-in mode for activating the function part 10 are alternately executed. COPYRIGHT: (C)2007,JPO&INPIT
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