<p>There is provided a test device including: a plurality of test signal supply units for supplying a test signal for writing test data into a memory under test of the connection destination to a terminal of memory under test; a plurality of terminal correspondence judgment units for outputting a terminal unit judgment result indicating whether the test data read out from the terminal of the connection destination coincides with an expected value; a judgment result selection unit for selecting the terminal unit judgment results outputted from the terminal correspondence judgment units for each of the memories under test; a memory correspondence judgment unit for judging whether write into the memory under test has been successful according to the selection result obtained by the judgment result selection unit; an identification unit for identifying a test signal supply unit connected to the memory under test in which write has been successful and a test signal supply unit connected to the memory under test in which write has failed; and a mask processing unit for instructing whether to perform re-testing for each of the test signal supply units according to the state whether the write has been successful.</p>
