INSPECTION SYSTEM, DELAY CIRCUIT, DATA COLLECTION APPARATUS, DATA DELAY METHOD, DATA DELAY PROGRAM, AND RECORDING MEDIUM
摘要
<P>PROBLEM TO BE SOLVED: To provide an inspection system capable of capturing test data that is output from an inspection device. <P>SOLUTION: The inspection system inspects the operation of peripheral equipment by connecting the peripheral equipment to the inspection device for performing an inspection program to inspect the operation of the peripheral equipment connected to a computer. The system includes: an input circuit which inputs the test data for performing inspection that is output from the inspection device to the peripheral equipment; a storage circuit which stores the test data that is input by the input circuit; and a delay circuit which delays the time enabling the input circuit to input the data. <P>COPYRIGHT: (C)2007,JPO&INPIT
