发明名称 Small sector floating gate flash memory
摘要 To control the problem of program and erase disturb in flash memory arrays having multiple sectors of cells grouped in each isolation wells of the flash memory array, a refresh procedure is used that involves two readings of each of the cells in a "refresh area" of a group under different read timing conditions, with other read conditions being constant or varied as desired. Cells that yield the same result in both reads are not excessively disturbed and need not be reprogrammed. However, cells that read differently may be excessively disturbed and should be reprogrammed. The refresh procedure is particularly suitable for memory arrays with small sector size and many sectors per group. The memory arrays preferably incorporate memory cells that use hot electron programming and Fowler-Nordheim erase.
申请公布号 US2006256606(A1) 申请公布日期 2006.11.16
申请号 US20050129646 申请日期 2005.05.13
申请人 NEXFLASH TECHNOLOGIES, INC. 发明人 PARK EUNGJOON
分类号 G11C17/00 主分类号 G11C17/00
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