发明名称 Front illuminated back side contact thin wafer detectors
摘要 The present invention is directed toward a detector structure, detector arrays, a method of detecting incident radiation, and a method of manufacturing the detectors. The present invention comprises several embodiments that provide for reduced radiation damage susceptibility, decreased affects of cross-talk, and increased flexibility in application. In one embodiment, the present invention comprises a plurality of front side illuminated photodiodes, optionally organized in the form of an array, with both the anode and cathode contact pads on the back side. The front side illuminated, back side contact photodiodes have superior performance characteristics, including less radiation damage, less crosstalk using a suction diode, and reliance on reasonably thin wafers. Another advantage of the photodiodes of the present invention is that high density with high bandwidth applications can be effectuated.
申请公布号 US2006255420(A1) 申请公布日期 2006.11.16
申请号 US20060401099 申请日期 2006.04.10
申请人 BUI PETER S;TANEJA NARAYAN D 发明人 BUI PETER S.;TANEJA NARAYAN D.
分类号 H01L31/00;H01L27/146;H01L31/06;H01L31/103;H01L31/18 主分类号 H01L31/00
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