发明名称 DIELECTRIC AND METHOD FOR FORMING THE SAME, SEMICONDUCTOR MEMORY DEVICE HAVING THE DIELECTRIC AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR MEMORY DEVICE
摘要 A dielectric layer is provided to avoid crystallization of a dielectric layer by interposing a second dielectric layer between first and third dielectric layer made of the same kind of materials having a dielectric constant of at least 25 such that the second dielectric layer is made of a different material from those of the first and the third dielectric layers and has a lower crystallization rate from those of the first and third dielectric layers. A first dielectric layer(10) has a dielectric constant of at least 25. A second dielectric layer(20) is formed on the first dielectric layer, made of a material having a lower crystallization rate than that of the first dielectric layer. A third dielectric layer(30) is formed on the second dielectric layer, made of the same material as that of the first dielectric layer. The first and the third dielectric layers have a thickness that is not crystallized, made of one of a group composed of ZrO2, HfO2, La2O3 and Ta2O5.
申请公布号 KR100648860(B1) 申请公布日期 2006.11.16
申请号 KR20050083692 申请日期 2005.09.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIL, DEOK SIN;HONG, KWON;YEOM, SEUNG JIN
分类号 H01L27/108 主分类号 H01L27/108
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