发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN METHOD THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit wherein a timing error hardly takes place in flip-flops even in the presence of manufacture tolerance. <P>SOLUTION: The design method of the semiconductor integrated circuit includes a step S202 of obtaining number of toggle times within a duration time of each clock signal, a step S203 of obtaining delay variations of each clock signal at a lapse of the duration time, a step S204 of obtaining a difference between the delay variations as to clock signals supplied to two storage cells, a step S205 of establishing the obtained difference for timing constraints between the two storage cells as a design margin, and a step S205 of executing timing adjustment of the circuit. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006313894(A) 申请公布日期 2006.11.16
申请号 JP20060107774 申请日期 2006.04.10
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUMURA YOICHI;OHASHI TAKAKO;FUJIMURA KATSUYA;ITO CHIHIRO;TANIGUCHI HIROKI
分类号 H01L21/82;G06F1/10;G06F17/50;H01L21/822;H01L27/04;H03K19/0175 主分类号 H01L21/82
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