发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN METHOD THEREOF |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit wherein a timing error hardly takes place in flip-flops even in the presence of manufacture tolerance. <P>SOLUTION: The design method of the semiconductor integrated circuit includes a step S202 of obtaining number of toggle times within a duration time of each clock signal, a step S203 of obtaining delay variations of each clock signal at a lapse of the duration time, a step S204 of obtaining a difference between the delay variations as to clock signals supplied to two storage cells, a step S205 of establishing the obtained difference for timing constraints between the two storage cells as a design margin, and a step S205 of executing timing adjustment of the circuit. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2006313894(A) |
申请公布日期 |
2006.11.16 |
申请号 |
JP20060107774 |
申请日期 |
2006.04.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MATSUMURA YOICHI;OHASHI TAKAKO;FUJIMURA KATSUYA;ITO CHIHIRO;TANIGUCHI HIROKI |
分类号 |
H01L21/82;G06F1/10;G06F17/50;H01L21/822;H01L27/04;H03K19/0175 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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