| 摘要 |
PROBLEM TO BE SOLVED: To inspect, measure, and select a fixed amount of chip components in a fixed time in a tester for chip components for electronic devices capable of processing at a high-speed. SOLUTION: An inspecting, measuring, and selecting device for the chip components for the electronic devices includes a test plate with inserting holes of the chip components which are divided into divisions in columns and rows, a squirt hole plate with squirt holes of compressed air arranged on the divisions which are agreed with the positions of the inserting holes by moving the test plate, a solenoid valve that pneumatically controls to discharge the chip components from the test plate by the compressed air when moving the test plate to the positions of the squirt holes that are classified and specified corresponding to performances and characteristics by the inspection and measurement, and a component container for selecting to accommodate the chip components discharged into a specified container. COPYRIGHT: (C)2007,JPO&INPIT
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