发明名称 |
Semiconductor device, method for testing the same and IC card |
摘要 |
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit via the output line. A test line is connected to the output line. A control circuit is arranged between the output line and the test line and configured to shut off a current flowing into the test line from the output line during a boosting operation of the boosting circuit.
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申请公布号 |
US2006255823(A1) |
申请公布日期 |
2006.11.16 |
申请号 |
US20060490077 |
申请日期 |
2006.07.21 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
NODA JUNICHIRO |
分类号 |
G01R31/02;G01R31/28;G06K17/00;G11C29/02;H01L21/66;H01L21/822;H01L27/04 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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