发明名称 AN APPARATUS AND METHOD FOR MEASURING A THICKNESS
摘要 A method and an apparatus for measuring the thickness of a plate-shaped object are provided to measure the thickness of the measured object, with the measured object being absorbed to a stage by vacuum. An apparatus for measuring the thickness of a plate-shaped object(10) measures the thickness of the plate-shaped object with a thickness measuring unit, with the plate-shaped object being positioned on a stage(300). A plurality of absorption holes(301) are formed in the stage to absorb the measured object by vacuum and adhere the measured object to the surface of the stage. A thickness measuring unit(200) measures the thickness of the measured object by comparing a first measurement value measuring a curved height of the surface of the stage with a second measurement value measuring the curve height of the measured object. An X-Y robot(400) moves the thickness measuring unit along the X-Y coordinate axes.
申请公布号 KR20060116767(A) 申请公布日期 2006.11.15
申请号 KR20060090854 申请日期 2006.09.15
申请人 KONG, BAE SUNG 发明人 KONG, BAE SUNG
分类号 G01B21/08;G01B21/30 主分类号 G01B21/08
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