首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
TRANSMISSIVE OPTISCHE PLATTE FÜR PHYSISCHE MESSUNGEN
摘要
申请公布号
AT342498(T)
申请公布日期
2006.11.15
申请号
AT20020750175T
申请日期
2002.07.19
申请人
BURSTEIN TECHNOLOGIES, INC.;NAGAOKA & CO., LTD.
发明人
WORTHINGTON, MARK;COOMBS, JAMES HOWARD;ORTIZ, VICTOR MANUEL;FIRSTMAN, CYNTHIA LOUISE
分类号
B01L3/00;G01N21/07;G01N21/64;G01N35/00;(IPC1-7):G01N21/55
主分类号
B01L3/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Method and system for providing a push-to-talk communication session
Method for Ensuring Security of Subscriber Card
Voltammetric detection of metabolites in physiological fluids
Architecture for generating intermediate representations for program code conversion
Patch management system
Monolithically integrated light emitting devices
VARIABLE LENGTH CODING METHOD AND APPARATUS FOR VIDEO COMPRESSION
Multi-layer writable optical record carrier with an optimum power calibration area, and method and apparatus for forming optimum power calibration areas on such a record carrier
TETRAHYDROISOQUINOLINE SULFONAMIDE DERIVATIVES, THE PREPARATION THEREOF, AND THE USE OF THE SAME IN THERAPEUTICS
Exhaust emission control device for internal combustion engine
Dynamically protecting against web resources associated with undesirable activities
Multi processor system and interrupt signal sending method therefor
Navigation apparatus, update data providing apparatus and update data providing method
Component mounting apparatus and component mounting method
METHODS AND APPARATUS FOR USING USER PERSONALITY TYPE TO IMPROVE THE ORGANIZATION OF DOCUMENTS RETRIEVED IN RESPONSE TO A SEARCH QUERY
Energy absorbing flexible foam
COPPER-BASED METAL POLISHING SOLUTION AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Digital inspection of the physical quality of plain surfaces
Method for Characterizing Defects on Semiconductor Wafers
METHODS OF ERASING AND DESIGNING ELECTRICALLY ERASABLE CHARGE TRAP NONVOLATILE MEMORY CELLS HAVING ERASE THRESHOLD VOLTAGE THAT IS HIGHER THAN AN INITIAL THRESHOLD VOLTAGE
