发明名称 SURFACE HARDENING METHOD OF PHOTO RESIST PATTERN
摘要 A method for hardening surface of photoresist pattern is provided to possibly etch a base material film even when the photoresist pattern is formed with reduced thickness by reacting the photoresist pattern with a curing catalyst to harden surface of the photoresist pattern. The method comprises the steps of: forming photoresist pattern(104) on a semiconductor substrate(100); and curing surface of the photoresist pattern by reacting the photoresist pattern with a curing catalyst. The surface curing step is performed by ammonia plasma treatment of the surface of the photoresist pattern. The curing catalyst is slantly introduced to top of the photoresist pattern to cure top portion of the photoresist pattern(104') and lateral part of the surface of the photoresist pattern adjacent to the cured top portion.
申请公布号 KR20060116490(A) 申请公布日期 2006.11.15
申请号 KR20050038909 申请日期 2005.05.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, CHANG SEOK
分类号 G03F7/26 主分类号 G03F7/26
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