发明名称 Integrated circuit verification scheme
摘要 A method for minimizing compilation time of a test case during development testing of an integrated circuit is provided. The method initiates with identifying a test case. The test case is associated with the tasks and the tasks are written as text files. Then, a file associated with the test case is generated. Next, a sequence of the tasks of the file is determined. Then, hardware description language (HDL) tasks, associated with the tasks of the file according to the sequence, are identified. Next, a simulation of an integrated circuit is performed through the HDL tasks. A computer readable medium having program instructions for minimizing compilation time of a test case during development testing of an integrated circuit and a system for testing an integrated circuit design are also provided.
申请公布号 US7137087(B1) 申请公布日期 2006.11.14
申请号 US20030645789 申请日期 2003.08.20
申请人 ADAPTEC, INC. 发明人 MOHANTY PURNA;THANGAVELU SIVAM;JAMBHEKAR VIVEK
分类号 G06F17/50 主分类号 G06F17/50
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