发明名称 |
Method and system for producing signals to test semiconductor devices |
摘要 |
A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.
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申请公布号 |
US7135881(B2) |
申请公布日期 |
2006.11.14 |
申请号 |
US20040018626 |
申请日期 |
2004.12.21 |
申请人 |
TERADYNE, INC. |
发明人 |
WALKER ERNEST;SARTSCHEV RONALD A. |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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