Testing apparatus and testing method

摘要

A testing apparatus for testing an electronic device, includes a deterministic jitter applying means for applying deterministic jitter to a given input signal without any amplitude variation component occurring and supplying the input signal applied with the deterministic jitter to the electronic device, a jitter amount controlling means for controlling magnitude of the deterministic jitter to be applied by the deterministic jitter applying means and a judging means for judging quality of the electronic device based on an output signal outputted by the electronic device in response to the input signal.