发明名称 Pattern-forming apparatus using a photomask
摘要 An apparatus for forming a pattern by using a photomask including both a minute aperture where a main component of a transmitted light is an evanescent light and an aperture where a main component of a transmitted light is a propagating light. The apparatus includes a sample stand for placing a substrate to be processed on which a photoresist with a film thickness equal to or smaller than a width of the minute aperture is formed, a stage for placing the photomask, a light source for generating light for exposure, and a device for controlling a distance between the substrate to be processed and the photomask.
申请公布号 US7136145(B2) 申请公布日期 2006.11.14
申请号 US20030630792 申请日期 2003.07.31
申请人 CANON KABUSHIKI KAISHA 发明人 YAMAGUCHI TAKAKO;KURODA RYO
分类号 G03B27/42;G03F1/08;G03B27/02;G03F1/00;G03F1/14;G03F1/60;G03F1/70;G03F7/16;G03F7/20;H01L21/027 主分类号 G03B27/42
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