发明名称 Illumination System Particularly For EUV Lithography
摘要 The system has at least one light source (1), at least one first mirror or lens divided into first raster elements (5) and one or more optical elements between the at least one mirror or lens and a reticle plane (14). The first raster element of the at least one mirror or lens divides a beam incident on the mirror or lens into sub-beams and deflects them through a first angle, whereby the first deflection angles of at least two sub-beams are different. Independent claims are also included for the following: (a) a projection illumination system for microlithography (b) and a method of manufacturing microelectronic components with an inventive projection illumination system.
申请公布号 KR100645411(B1) 申请公布日期 2006.11.14
申请号 KR19990016095 申请日期 1999.05.04
申请人 发明人
分类号 G21K5/00;G03F7/20;G21K1/06 主分类号 G21K5/00
代理机构 代理人
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