发明名称 WIRING STRUCTURE OF A SEMICONDUCTOR PACKAGE, METHOD OF MANUFACTURING THE WIRING STRUCTURE AND WAFER LEVEL PACKAGE USING THE WIRING STRUCTURE, AND METHOD OF MANUFACTURING THE WAFER LEVEL PACKAGE
摘要 <p>An interconnection structure of a semiconductor package is provided to more simplify the fabricating process of an interconnection structure by forming a contact hole for exposing an interconnection on a photoresist pattern without removing a preliminary photoresist structure from a conductive pattern such that the preliminary photoresist structure is disposed on the conductive pattern to form a conductive pattern connected to a pad. A pad(110) inputs a signal to a circuit part(105) or outputs a signal from the circuit part, disposed on a body(102) with the circuit part. A conductive pattern(120) is disposed on the upper surface of the body, electrically connected to the pad. An insulating photoresist structure(130) is formed on the upper surface of the conductive pattern, having a contact hole for exposing a part of the upper surface of the conductive pattern. The insulating photoresist structure has substantially the same outer shape as the conductive pattern.</p>
申请公布号 KR100647483(B1) 申请公布日期 2006.11.13
申请号 KR20050076286 申请日期 2005.08.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, IN YOUNG;SIM, SUNG MIN;JANG, DONG HYEON;CHUNG, HYUN SOO;CHUNG, JAE SIK;RYU, SEUNG KWAN;PARK, MYEONG SOON;YOON, JONG KOOK;CHOI, JU IL
分类号 H01L23/48 主分类号 H01L23/48
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