发明名称 THIN FILM SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING THE SAME
摘要 The invention provides a thin film semiconductor element and a method of manufacturing the same to achieve lowering the resistance of gate electrodes, lowering the capacitance of source electrodes, and enhancing etching characteristics. The thin film semiconductor element can include a semiconductor film provided on a substrate, source and drain electrodes connected to the semiconductor film, and a gate electrode provided on the semiconductor film with an insulating film interposed therebetween. The film thickness of the source and drain electrodes can be smaller than the film thickness of the gate electrode.
申请公布号 KR100644122(B1) 申请公布日期 2006.11.10
申请号 KR20040044182 申请日期 2004.06.15
申请人 发明人
分类号 H01L21/28;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/417;H01L29/423;H01L29/45;H01L29/49;H01L29/786 主分类号 H01L21/28
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