发明名称 APERTURE ASSEMBLY OF A SCANNING ELECTRON MICROSCOPE
摘要 An aperture assembly of a scanning electron microscope is provided to increase the number of apertures and simplify an aligning process by using a circular aperture plate. An aperture assembly of a scanning electron microscope includes a body, a circular aperture plate(120), and a plate rotating unit(130). The body includes a guide part(111) which is moved to an X-axis direction and a Y-axis direction by operating an X-axis control knob and a Y-axis control knob. The circular aperture plate is installed at the guide part of the body in order to be positioned on an electron beam path. A plurality of apertures(121) for focusing electron beams are formed along an edge of the circular aperture plate. The plate rotating unit rotates the circular aperture plate.
申请公布号 KR20060115796(A) 申请公布日期 2006.11.10
申请号 KR20050038103 申请日期 2005.05.06
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 YANG, DAE SEOK
分类号 H01J37/26 主分类号 H01J37/26
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