发明名称 INSPECTION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measuring device and method capable of performing high-speed inspection by a thermo-reflectance method. SOLUTION: The measuring device has a confocal optical system having a Nipkow disk 120, radiates laser beams for inspection and heating to a plurality of places of an inspected sample via the confocal optical system, and simultaneously obtains thermophysical property information of the plurality of places based on the reflected lights from the plurality of places of the inspected sample. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006308513(A) 申请公布日期 2006.11.09
申请号 JP20050134085 申请日期 2005.05.02
申请人 NEC ELECTRONICS CORP 发明人 NAKAMURA TOYOKAZU
分类号 G01N25/72;G01J5/00;G01J5/48;G01N21/47;G01N21/956 主分类号 G01N25/72
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