摘要 |
PROBLEM TO BE SOLVED: To provide an IC testing device that can accurately press a lead terminal of an IC onto a contact pin of a socket with a lead presser, by securing play of x, y andθdirections of the lead presser and reducing the play of the tilting (rocking) direction. SOLUTION: The IC testing device comprises the socket for performing electric measurement of the IC, a stage replacing component, and a device body to be mounted with the stage replacing component. The stage replacing component comprises the lead presser for pressing the lead terminal of the IC onto the contact pin of the socket, a pressurization shaft fixed on the lead presser, an adapter that is disposed between the lead presser and the pressurization shaft and is a connecting part with the device body, and a thrust bearing section disposed between the adapter and pressurization shaft and between the adapter and lead presser. COPYRIGHT: (C)2007,JPO&INPIT
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