发明名称 IC TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an IC testing device that can accurately press a lead terminal of an IC onto a contact pin of a socket with a lead presser, by securing play of x, y andθdirections of the lead presser and reducing the play of the tilting (rocking) direction. SOLUTION: The IC testing device comprises the socket for performing electric measurement of the IC, a stage replacing component, and a device body to be mounted with the stage replacing component. The stage replacing component comprises the lead presser for pressing the lead terminal of the IC onto the contact pin of the socket, a pressurization shaft fixed on the lead presser, an adapter that is disposed between the lead presser and the pressurization shaft and is a connecting part with the device body, and a thrust bearing section disposed between the adapter and pressurization shaft and between the adapter and lead presser. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006308495(A) 申请公布日期 2006.11.09
申请号 JP20050133411 申请日期 2005.04.28
申请人 RENESAS TECHNOLOGY CORP 发明人 TAKAMURA JIRO;SENBA SHINJI;SAKAMOTO TETSUYA;SAKAI IWAO;WATANABE FUTOSHI
分类号 G01R31/26;H01R33/76 主分类号 G01R31/26
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