SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING AND MEASURING SAME

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device capable of being easily subjected to a physical test without deteriorating characteristics.

SOLUTION: According to a method of measuring a semiconductor device in which an element layer provided with a test element including a terminal is sealed with first and second films having flexibility, the first film formed over the terminal is removed to form a contact hole to the terminal, the contact hole is filled with a resin containing a conductive material, heating is carried out after arranging a wiring substrate having flexibility over the resin with which filling has been performed so that the terminal and the flexible wiring substrate are electrically connected via the resin containing a conductive material, and a measurement is performed.

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