发明名称 Method of manufacturing semiconductor device having trench isolation
摘要 A semiconductor device includes a plurality of circuit portions of different functions each constructed by including a MOS transistor on an SOI substrate obtained by sequentially stacking a semiconductor substrate, a buried insulating film and a semiconductor layer. The semiconductor device includes first and second portions. The first circuit portion is isolated by being surrounded with a first insulating film provided on an upper portion of the semiconductor layer and a second insulating film penetrating the semiconductor layer to reach the buried insulating film.
申请公布号 US2006249756(A1) 申请公布日期 2006.11.09
申请号 US20060481799 申请日期 2006.07.07
申请人 RENESAS TECHNOLOGY CORP. 发明人 MATSUMOTO TAKUJI;TSUJIUCHI MIKIO;IWAMATSU TOSHIAKI;MAEDA SHIGENOBU;HIRANO YUUICHI;MAEGAWA SHIGETO
分类号 H01L21/66;H01L29/768;H01L21/336;H01L21/76;H01L21/762;H01L21/8238;H01L21/8244;H01L21/84;H01L27/08;H01L27/092;H01L27/10;H01L27/11;H01L27/12;H01L29/786 主分类号 H01L21/66
代理机构 代理人
主权项
地址