发明名称 METHOD FOR MEASURING CLEANLINESS OF OBJECT TO BE MEASURED
摘要 PROBLEM TO BE SOLVED: To rapidly and simply measure cleanliness of an object to be measured, such as a glass substrate or the like, without requiring a special device, such as image recognition device or the like. SOLUTION: A droplet 10 is dropped onto a surface of the object to be measured 1, such as the glass substrate or the like by using a dispenser 2. Since a certain degree of cleaning finishing has been applied to the object to be measured 1, the droplet 10 dropped spreads in circular form, as time elapses. A screen 3, used as a scale, is disposed below the object to be measured 1. When light is supplied from the upper position of the object to be measured 1, image of the droplet 10 is projected on the screen 3. The screen 3 has a scale mark M, consisting of X-axis and Y-axis, and the cleanliness of the object to be measured 1 is measured, based on the scale mark M and the image of the droplet 10 projected to the screen 3. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006308503(A) 申请公布日期 2006.11.09
申请号 JP20050133795 申请日期 2005.05.02
申请人 FUJINON SANO KK 发明人 NAKAMURA HIROSHI
分类号 G01N13/00;B08B3/02 主分类号 G01N13/00
代理机构 代理人
主权项
地址