发明名称 |
SEMICONDUCTOR HAVING CONTACT AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor device with a contact and a method for manufacturing the same are provided to improve overlap margin between the contact and a bit line in core region by forming a conductive stud through the bit line. A first interlayer dielectric(130) is formed on a semiconductor substrate(100) of a core region. A first interconnection line(132) has a first width on the first interlayer dielectric and is extended in a first direction. A conductive stud(136) is covered at sidewalls of the first interconnection line and contacted to the substrate through the first interconnection line. The first interconnection line is a core bit line.
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申请公布号 |
KR20060115450(A) |
申请公布日期 |
2006.11.09 |
申请号 |
KR20050037849 |
申请日期 |
2005.05.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JE MIN |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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