发明名称 SEMICONDUCTOR HAVING CONTACT AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device with a contact and a method for manufacturing the same are provided to improve overlap margin between the contact and a bit line in core region by forming a conductive stud through the bit line. A first interlayer dielectric(130) is formed on a semiconductor substrate(100) of a core region. A first interconnection line(132) has a first width on the first interlayer dielectric and is extended in a first direction. A conductive stud(136) is covered at sidewalls of the first interconnection line and contacted to the substrate through the first interconnection line. The first interconnection line is a core bit line.
申请公布号 KR20060115450(A) 申请公布日期 2006.11.09
申请号 KR20050037849 申请日期 2005.05.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JE MIN
分类号 H01L21/28 主分类号 H01L21/28
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