发明名称 |
SKIN CONDITION ANALYZING METHOD, SKIN CONDITION ANALYZER, SKIN CONDITION ANALYZING PROGRAM, AND RECORDING MEDIA WHERE THAT PROGRAM IS RECORDED |
摘要 |
<P>PROBLEM TO BE SOLVED: To analyze a texture or pores of the skin of a subject with a high degree of accuracy. <P>SOLUTION: In a skin condition analyzing method to analyze the texture or the pores of the skin using a photographed image of the skin of the subject, the problem mentioned above is solved by having a parameter generating step to parameterize at least one of a pore size, furrow vividness, ridge fineness, and ridge shape obtained from the image and an analyzing step to analyze the texture or the pores of the skin based on the parameter obtained from the parameter generating step. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006305184(A) |
申请公布日期 |
2006.11.09 |
申请号 |
JP20050133275 |
申请日期 |
2005.04.28 |
申请人 |
SHISEIDO CO LTD |
发明人 |
ARAKAWA NAOMI;MASUDA YUJI;ONISHI HIROYUKI |
分类号 |
A61B5/107;A61B5/00;G06T1/00 |
主分类号 |
A61B5/107 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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