发明名称 |
SILICON NITRIDE SUBSTRATE, PROCESS FOR PRODUCING THE SAME, AND SILICON NITRIDE WIRING BOARD AND SEMICONDUCTOR MODULE USING THE SAME |
摘要 |
<p>This invention provides a silicon nitride substrate, which has a high coefficient of thermal conductivity in the thickness-wise direction and has high fracture toughness in the thickness-wise direction, a silicon nitride wiring board using the silicon nitride substrate, which has low heat resistance and is highly reliable, and a semiconductor module using this silicon nitride wiring board, which has low heat resistance and is highly reliable. The silicon nitride substrate comprises ß-type silicon nitride and at least one rare earth element. The degree of in-plane orientation fa of the silicon nitride substrate is 0.4 to 0.8. In this case, the degree of in-plane orientation fa refers to the proportion of orientation in a plane perpendicular to the thickness-wise direction determined based on the proportion of each X-ray diffraction line intensity for a predetermined lattice plane of ß-type silicon nitride.</p> |
申请公布号 |
WO2006118003(A1) |
申请公布日期 |
2006.11.09 |
申请号 |
WO2006JP307936 |
申请日期 |
2006.04.14 |
申请人 |
HITACHI METALS, LTD.;KAGA, YOUICHIROU;KIKUCHI, HIROMI;IMAMURA, HISAYUKI;WATANABE, JUNICHI |
发明人 |
KAGA, YOUICHIROU;KIKUCHI, HIROMI;IMAMURA, HISAYUKI;WATANABE, JUNICHI |
分类号 |
C04B35/593;H01L23/14 |
主分类号 |
C04B35/593 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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