发明名称 TESTING DEVICE FOR INTERFERENCE REJECTION CAPABILITY
摘要 PROBLEM TO BE SOLVED: To provide a testing device for interference rejection capability which can use a low-cost and low-output power amplifier. SOLUTION: The testing device for interference rejection capability 1 comprises a signal generator 10 generating a high-frequency signal, a radiation antenna 5, an amplifier 13, and a table 3 mounting a device to be tested 2. The radiating antenna 5 is equipped with an electromagnetic horn 4 and a waveguide 8, having the same aperture as the aperture of the electromagnetic horn 4. The electromagnetic horn 4 and the waveguide 8 are made to be installed on the same axial line as the radiation axis line 12 of the electromagnetic horn 4 and close to each other. The electromagnetic waves, radiated from the electromagnetic horn 4, are guided to the waveguide 8, and the guided electromagnetic waves are radiated to the device to be tested 2. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006308546(A) 申请公布日期 2006.11.09
申请号 JP20050313405 申请日期 2005.10.27
申请人 MASPRO DENKOH CORP 发明人 SUGIURA TOSHIHIRO;TAKEDA SEISO;TAKAHASHI JUNICHI
分类号 G01R31/00;H01P1/165;H01Q13/02 主分类号 G01R31/00
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