发明名称 SCANNING STAGE FOR SCANNING PROBE MICROSCOPE
摘要 <p>A scanning stage is provided with a stage (9) for holding an observing sample and a scanning mechanism which can move the stage (9) in X, Y and Z directions. The scanning mechanism is provided with an XY stage composed of a movable section (4), an XY elastic member and Z elastic members (7A, 7B) and a fixing section (5); a fixing table (1) for fixing the XY stage; an X piezoelectric body (2A) for moving the movable section (4) in the X direction; a Y piezoelectric body for moving the movable section (4) in the Y direction; and a piezoelectric body (3) for moving the stage (9) in the Z direction. The Z piezoelectric body (3) is fixed on an upper plane of the movable section (4), and the stage (9) is fixed on an upper plane of the Z piezoelectric body (3) by a wax (10).</p>
申请公布号 WO2006118117(A1) 申请公布日期 2006.11.09
申请号 WO2006JP308661 申请日期 2006.04.25
申请人 OLYMPUS CORPORATION;UE, YOSHIHIRO 发明人 UE, YOSHIHIRO
分类号 G01B21/30;G01Q10/00;G01Q30/08;G01Q30/20 主分类号 G01B21/30
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