| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for evaluating the alignment state of alignment layers, capable of satisfactorily evaluating the alignment state of the alignment layers, without having to depend on the type of underlying substrates with which the alignment layers are formed or the film thickness of the alignment layers. SOLUTION: The method is provided with a step for applying a light-emitting polymer liquid made of a fluorescent material, which is oriented, reflecting the alignment state of a substrate, on an alignment layer to be evaluated; a step for forming a light-emitting polymer film 2b, by heating and treating the applied light-emitting polymer liquid; a step for measuring a polarized fluorescent spectrum of the light-emitting polymer film 2b; and a step for determining alignment parameters on the basis of an alignment function expression, on the basis of measurement results of the polarized fluorescent spectrum and evaluating the alignment state of the alignment layer, on the basis of the acquired alignment parameters. COPYRIGHT: (C)2007,JPO&INPIT |
