发明名称 Test apparatus having intermediate connection board for package
摘要 A test apparatus may include a test socket having socket pins with a standard configuration. An intermediate connection board may be interposed between the test socket and a package that has solder balls with a non-standard configuration. The intermediate connection board may have contact balls and contact pads. The contact balls may be arranged in a configuration that is compatible with the standard socket pin configuration, and the contact pads may be arranged in a configuration that is compatible with the non-standard solder ball configuration.
申请公布号 US7131847(B2) 申请公布日期 2006.11.07
申请号 US20040001182 申请日期 2004.12.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JONG-JOO
分类号 H01L21/66;H01R12/00;H01R13/24;H05K1/00 主分类号 H01L21/66
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