发明名称 Method of eliminating source/drain junction spiking, and device produced thereby
摘要 A method of forming an integrated circuit with a semiconductor substrate is provided. A gate dielectric is formed on the semiconductor substrate, and a gate is formed on the gate dielectric. A metallic layer is formed on the semiconductor substrate, and the metallic layer is reacted with the semiconductor substrate to form an early phase of silicide. Implanted shallow source/drain junctions are formed immediately beneath the silicide. A final phase of the silicide is formed. An interlayer dielectric is deposited above the semiconductor substrate, and contacts are then formed to the silicide.
申请公布号 US7132352(B1) 申请公布日期 2006.11.07
申请号 US20040913184 申请日期 2004.08.06
申请人 ADVANCED MICRO DEVICES, INC. 发明人 CHAN SIMON SIU-SING;BESSER PAUL R.;PATTON JEFFREY P.
分类号 H01L21/28 主分类号 H01L21/28
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