Semiconductor integrated circuit including operation test circuit and operation test method thereof

摘要

A semiconductor integrated circuit disclosed herein comprising: a phase control circuit which shifts a phase of a first clock signal based on a phase control signal and outputs a second clock signal; a first flip-flop to which one of the first clock signal and the second clock signal is inputted as a first operation clock signal, and which outputs evaluation data; a circuit under test which performs a predetermined process based on the evaluation data and outputs a result of the process as output data; and a second flip-flop to which the other of the first clock signal and the second clock signal is inputted as a second operation clock signal and the output data is inputted, and which outputs the output data inputted from the circuit under test.