发明名称 CMOS IMAGE SENSOR
摘要 A CMOS image sensor is provided to prevent electrons from moving directly from a photodiode to a floating node using a blocking region. A CMOS image sensor comprises a photodiode, a gate pattern of a transfer transistor(Tx), and a blocking region. The gate pattern is used for transferring selectively the electrons stored in the photodiode to a floating node. The blocking region is arranged at an end of a contact portion between the gate pattern and the photodiode to restrain the electrons of the photodiode from being directly transferred into the floating node without the use of a channel of the gate pattern.
申请公布号 KR20060114249(A) 申请公布日期 2006.11.06
申请号 KR20050036287 申请日期 2005.04.29
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, EUN JI
分类号 H01L27/146 主分类号 H01L27/146
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