| 摘要 |
A control system comprises a control apparatus 17 that controls a process apparatus 10, which performs a predetermined process on a wafer W, based on plural pieces of process information to be detected in the process apparatus 10, and alarm generation means 21 which generates an alarm when the detected process information is off a predetermined range. The control apparatus 17 grasps the generation state of an alarm, and gives warning when the generation state reaches a predetermined threshold.
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