发明名称 |
A MOSFET HAVING ISOLATION STRUCTURE FOR SINGLE CHIP INTEGRATION AND METHODS OF MANUFACTURING THE SAME |
摘要 |
<p>A metal oxide semiconductor (MOS) field effect transistor device having isolation structure for single chip integration, wherein PMOS field effect transistor comprises: a first N-type well formed in the P-type substrate, a first P-type area formed in the first N-type well, a P+-type drain region formed in the first P-type area, a P+-type source region and a N+-type contact region form a first source electrode, the first N-type well surrounds P+-type source region and N+-type contact region of PMOSFET; NMOS field effect transistor comprises: a second N-type well formed in the P-type substrate, a second P-type area formed in the second N-type well, a N+-type drain region formed in the second N-type well, a N+-type source region and a P+-type contact region form a second source electrode, the second P-type area surrounds N+-type source region and P+-type contact region of NMOS field effect transistor, a plurality of separate P-type area are formed in P-type substrate to provide an isolation between the transistors.</p> |
申请公布号 |
WO2006114029(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
WO2005CN01686 |
申请日期 |
2005.10.14 |
申请人 |
SYSTEM GENERAL CORP.;HUANG, CHIH-FENG;CHIEN, TUO-HSIN;LIN, JENN-YU G.;YANG, TA-YUNG |
发明人 |
HUANG, CHIH-FENG;CHIEN, TUO-HSIN;LIN, JENN-YU G.;YANG, TA-YUNG |
分类号 |
H01L21/76;H01L27/10;H01L29/786 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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地址 |
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