| 摘要 |
A defect judging method of a light emitting display is provided to determine that defective pixels are included in the light emitting display, if the amount of leak current is over 1muA in applying inverse voltage. A defect judging method of a light emitting display includes the steps of: manufacturing the light emitting display displaying an image by pixels including a light emitting element and a pixel circuit; applying inverse voltage to the light emitting element; and judging defects of the light emitting display by measuring the leak current flowing in light emitting element. The defect judging method determines that the light emitting display is defective if the absolute value of the leak current is over a predetermined value.
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