发明名称 |
INFRARED DETECTOR, AND INFRARED SOLID IMAGING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an infrared detector generating no inclination in a detection part or the like by an internal stress, and also to provide an infrared solid imaging device including the same. <P>SOLUTION: This substantially rectangular infrared detector for detecting a temperature change of the detection part by a detection film includes: a substrate; the detection part provided with the detection film; a support leg for supporting the detection part on the substrate; and a wiring layer provided in the support leg and connected to the detection film. The infrared detector has a structure to bring the support leg into a condition axisymmetric to a normal to a substrate surface, in an intersection of diagonal lines of the infrared detector. The infrared solid imaging device includes the infrared detectors arranged matrixlikely. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006300816(A) |
申请公布日期 |
2006.11.02 |
申请号 |
JP20050124994 |
申请日期 |
2005.04.22 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
OTA YASUAKI;NAKAGI YOSHIYUKI |
分类号 |
G01J1/02;H01L27/14;H01L31/02;H01L35/32;H01L37/00;H01L37/02;H01L37/04;H04N5/33 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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