发明名称 INFRARED DETECTOR, AND INFRARED SOLID IMAGING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an infrared detector generating no inclination in a detection part or the like by an internal stress, and also to provide an infrared solid imaging device including the same. <P>SOLUTION: This substantially rectangular infrared detector for detecting a temperature change of the detection part by a detection film includes: a substrate; the detection part provided with the detection film; a support leg for supporting the detection part on the substrate; and a wiring layer provided in the support leg and connected to the detection film. The infrared detector has a structure to bring the support leg into a condition axisymmetric to a normal to a substrate surface, in an intersection of diagonal lines of the infrared detector. The infrared solid imaging device includes the infrared detectors arranged matrixlikely. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006300816(A) 申请公布日期 2006.11.02
申请号 JP20050124994 申请日期 2005.04.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 OTA YASUAKI;NAKAGI YOSHIYUKI
分类号 G01J1/02;H01L27/14;H01L31/02;H01L35/32;H01L37/00;H01L37/02;H01L37/04;H04N5/33 主分类号 G01J1/02
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