发明名称 METHOD OF DICING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a dicing method capable of suppressing the progress of chipping generated when dicing used in a semiconductor wafer manufacturing process. SOLUTION: One or a plurality of strip-like films are provided on at least one side of a scribe line of the circuit forming surface of a wafer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006302939(A) 申请公布日期 2006.11.02
申请号 JP20050118157 申请日期 2005.04.15
申请人 CANON INC 发明人 KAWAGUCHI TORU
分类号 H01L21/301 主分类号 H01L21/301
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