| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC testing device capable of preventing a test cost from increasing in accompaniment to enhancement of performance in a testing object. SOLUTION: This IC testing device is provided with a master test IC 2 connected to a tested IC 1 with a plurality of data transmission routes, and for transmitting a test data to the tested IC 1, and a nondefective determination part 3 for determining the quality of the tested IC 1, the master test IC 2 determines the quality of a data transmission function of the tested IC 1 in the data transmission route through which the test data and a response data are transmitted, based on the tset data transmitted to the tested IC 1, and the response data, received from the tested IC 1, to the test data, the nondefective determination part 3 determines the quality of the tested IC 1, based on at least a determination result by the master test IC 2, and the master test IC 2 is the tested IC 1 determined as a nondefective in the past by the nondefective determination part 3, or the tested IC 1 determined as the nondefective in other test. COPYRIGHT: (C)2007,JPO&INPIT
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