发明名称 APPARATUS AND METHOD FOR CORRECTION OR EXTENSION OF X-RAY PROJECTIONS
摘要 The present invention relates to an apparatus for iterative scatter correction of a data set of x-ray projections (10) of an object (1) for generation of a reconstruction image of said object. In particular for correction of artifacts caused by scatter or a truncation of x- ray projections, an apparatus is proposed, which requires less computational effort and which thus allows a correction in real-time, comprising: a model estimation unit (41) for estimating model parameters of an object model for said object by an iterative optimization of a deviation of forward projections, calculated by use of said object model and the geometry parameters for said x-ray projections, from the corresponding x-ray projections, - a scatter estimation unit (42) for estimating the amount of scatter present in said x-ray projections by use of said object model, and a correction unit (43) for correcting said x-ray projections by subtracting the estimated amount of scatter from said x-ray projections for determining an optimized object model using said corrected x-ray projections, said optimized object model being used in another iteration of said scatter correction, said scatter correction being iteratively carried out until a predetermined stop criterion has been reached. Further, corresponding apparatus for extension of truncated projections and a reconstruction apparatus is proposed.
申请公布号 WO2006082557(A3) 申请公布日期 2006.11.02
申请号 WO2006IB50329 申请日期 2006.01.31
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;BERTRAM, MATTHIAS;WIEGERT, JENS 发明人 BERTRAM, MATTHIAS;WIEGERT, JENS
分类号 G01N23/04;A61B6/03;G06T11/00 主分类号 G01N23/04
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