发明名称 |
Artifact-reduced magnetic resonance tomography imaging calibrating method for medical application, involves determining device-specific time delay as slope of linear function between field of view displacements and phase values |
摘要 |
<p>The method involves specifying read-out direction and measuring phase values in a Fourier DC point for different field of view (FOV) displacements in the read-out direction. The device-specific time delay is determined as a slope of a linear function between the FOV displacements and phase values. The measuring and determining operations are repeated for variation of measurement parameter until a mathematical correlation is determined between the device-specific time delay and measurement parameter. Independent claims are included for the following: (1) artifact-reduced magnetic resonance tomography imaging measuring method; and (2) artifact-reduced magnetic resonance tomography imaging correction method.</p> |
申请公布号 |
DE102005019214(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
DE20051019214 |
申请日期 |
2005.04.25 |
申请人 |
SIEMENS AG |
发明人 |
SPEIER, PETER;TRAUTWEIN, FLORIAN |
分类号 |
G01R33/58;G01R33/563 |
主分类号 |
G01R33/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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