发明名称 Artifact-reduced magnetic resonance tomography imaging calibrating method for medical application, involves determining device-specific time delay as slope of linear function between field of view displacements and phase values
摘要 <p>The method involves specifying read-out direction and measuring phase values in a Fourier DC point for different field of view (FOV) displacements in the read-out direction. The device-specific time delay is determined as a slope of a linear function between the FOV displacements and phase values. The measuring and determining operations are repeated for variation of measurement parameter until a mathematical correlation is determined between the device-specific time delay and measurement parameter. Independent claims are included for the following: (1) artifact-reduced magnetic resonance tomography imaging measuring method; and (2) artifact-reduced magnetic resonance tomography imaging correction method.</p>
申请公布号 DE102005019214(A1) 申请公布日期 2006.11.02
申请号 DE20051019214 申请日期 2005.04.25
申请人 SIEMENS AG 发明人 SPEIER, PETER;TRAUTWEIN, FLORIAN
分类号 G01R33/58;G01R33/563 主分类号 G01R33/58
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