发明名称 ANALYZING DEVICE AND ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an analyzing device capable of obtaining the good precision of an irradiation position when a sample is irradiated with light, and an analyzer. SOLUTION: The analyzer 10 is equipped with a substrate 8 having a groove 2 in which the sample (a) is housed, a light waveguide 4 of which one end 4a and other end 4b are optically connected to the groove 2 and a light waveguide 6 of which one end 6a and other end 6b are optically connected to one end 4a of the light waveguide 4 through the groove 2. A light source 12 is optically connected to the other end 4b of the light waveguide 4 and a photodetector 14 is optically connected to the other end 6b of the light waveguide 6. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006300564(A) 申请公布日期 2006.11.02
申请号 JP20050118816 申请日期 2005.04.15
申请人 SUMITOMO ELECTRIC IND LTD 发明人 FUKUDA CHIE
分类号 G01N21/01;G01N21/03;G01N21/27;G01N21/64;G01N21/65 主分类号 G01N21/01
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